E19101 - SEMI E191.1 - Specification for SECS-II Protocol for Computing Device Cybersecurity Status Reporting Revision:SEMI E191.1-1024 - Current under a set of closely

under a set of closely controlled test conditions

This Test Method provides procedures for the determination of relative radial variation of resistivity of semiconductor wafers cut from silicon single crystals grown either by the Czochralski or floating-zone technique

temperature

This Specification also sets procurement requirements

E19101 - SEMI E191.1 - Specification for SECS-II Protocol for Computing Device Cybersecurity Status Reporting Revision:SEMI E191.1-1024 - Current under a set of closelyNOTICE: By purchasing this download, you will receive the Primary Standard, SEMI E191 and the Subordinate Standard, SEMI E191. 1. If you purchase this download, you do not need to purchase the SEMI E191 download. 1 Purpose 1. 1 This Specification maps the services and data of SEMI E191 to SECS II data definitions. 2 Scope 2. 1 The scope of this Specification is the faithful representation of the messages and services to support SEMI E191 with SECS II