JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working

JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM WorkingJEOL Column Electron Detector Assembly JWS 2000 Wafer Defect Review SEM Working Part No: Electron Detector Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Detector Assembly is working surplus. Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling. Sale Details Item

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