Tin on Carbon on Grid, High Magnification

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Description

Tin on Carbon on Grid, High MagnificationDESCRIPTION SEM Resolution Test Specimens; Tin on Carbon Tin spheres on carbon a very useful for SEM, FESEM, FIB astigmatism correction due to their nearly perfect round shape. Tin on carbon is also used instead of gold on carbon where gold is not allowed in the SEM, FESEM or FIB, such as in semiconductor applications. The round tin spheres are particularly useful for testing image quality, distortion, contrast, brightness and probe size. Available in

5 formulated specifically for fine polishing of silicon wafers and devices

The world's first probe targeted at delivering high resolution on single biomolecules

15 and 20mm AFM/STM discs in a dust-free environment

single-cantilever AFM probes is the freedom to choose in the very last moment the right cantilever for each application

Applicable Instrument_All

Si3N4 50nm membrane with 0

µm % Trans-

16002-1 - Quartz Disc

Tip Geometry: Rotated (Symmetric) Tip Height: 1

- Use TERS-SMPL to test these probes at 633 nm excitation

TEM Support Film Product Note

Material: machined aluminum with stainless steel allen screws