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Description

ElectriCont-GElectrical, Contact Mode AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Electrical, Contact Mode AFM Probe Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as: scanning capacitance microscopy (SCM) scanning probe lithography The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The

curved 2ab 120mm NM-SS PTFE Coated 1

tabbed grids

light microscope or any imaging system with X and Y stage movements

The staining pad is 3

The small square contains circular holes with a 500 nm pitch

Covers are included with purchase of the Fluid Heater for BioScope SPM

SS (15390-P

and smaller flat samples

The PELCO® Pro Gold Plated Tweezers are high precision tweezers with fine points and an excellent price/performance ratio

High Efficiency Direct Drive TappingMode Probe Holder for Scanning in Fluid with Dimension Series SPMs

02") thick Silicon Chip Specimen Supports to demonstrate functionality

Sold in packs of 100