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HS-500MGHeight Calibration Standard, 500 nm DESCRIPTION Height Calibration Standard, 500 nm The problem: Atomic Force Microscopy has become a valuable tool not only for visualization but also for performing accurate measurements on the nanometer and micrometer scale. In order to make the most of their measurement capabilities, AFM systems need to be properly calibrated. The solution: HS 500MG is one of the height standards introduced by BudgetSensors as a

not for Conductive or Tunneling AFM

M4 threaded hole in base

Ductile iron facture

resulting in four unique nominal values for force constant and resonant frequency

16091-24 - Carbon Tabs with Al

3mm 5040-SV-1 ESD Safe

Available in the popular 12

Total thickness is 260µm with a liner on both sides

509% Cr = 18

Elec Micr Soc Amer

SHAPE Rotated Tip Height 17µm - From 15µm To 19µm Tip Setback 15µm - From 10µm To 20µm Tip Radius < 15nm Half Cone Angle 20°-25° along cantilever axis

These tips are sharper and last longer than any other electrical AFM probe

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