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Description

xSol 25 High Load Berkovich, SapphireDESCRIPTION xSol 25 High Load Berkovich, Sapphire 3 sided pyramidal sapphire probe for heating

Cantilever Material: 1 Ωcm Silicon Cantilever Thickness (Nom): 2 Cantilever Thickness (RNG): 1

Silicon p-type <100> calibration structure

Bruker’s new line of FESP high quality premiumetched silicon probes set the industry standard for soft TappingMode imaging and force modulation in air

15 Cantilever Geometry: Rectangular Cantilevers Number: 1

2 nm and 1

No tip image available

The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2

- Quantity 1

moderate 0

Tip Geometry: Rotated Tip Height: 3 - 8 Front Angle: 15 Back Angle: 1 - 24 Tip Radius (Nom): 1 Tip Radius (Max): 2 Tip Set Back (Nom): 3 Tip Set Back( RNG): 0-5

The Aluminum reflective coating on the back of the cantilever increases the laser signal by 2

ScanningCapacitance Microscopy (SCM)

Exchange/Return Notes