Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

DDRFESP40DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Brukers new series of conductive diamond coated probes provide consistent performance with high wear resistance in mechanical and electrical applications. In mechanical applications, these probes provide extreme wear resistance. On a Bruker Dimension Icon with FASTForce Volume Contact Resonance, these probes provide consistent results over many dozens of images. In electrical applications, these

Enables customers to evaluate the capabilities of PeakForce QNMon-site for six months before committing to purchase of the completepackage

High resolution electrical imaging with a sharp conductive tip

- Nanomechanical mapping with FFV or PFQNM on Dimension Icon

to enable fully quantitative nanomechanical measurements

55 Cantilever Thickness (RNG): 0

Continuous imaging of the DNA double helix obtained while operating on an inverted optical microscope

For the highest resolution nanoelectrical measurements with outstanding wear resistance

Au Reflex Coating DESCRIPTION

Max Overhang = 15 nm

5 Tip Radius (Nom): 8 Tip Radius (Max): 12 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25

This Bruker SurfaceTopography Reference Dies have a variety of step heights and pitches fordaily monitoring of SPM performance

Cover Glass for Second Generation Dimension EC Cell