Ge Wafer Undoped (110) 3" dia x 0.5 mm 2 side polished resistivity: >50 ohm-cm Battery Cell Tester

Ge Wafer Undoped (110) 3" dia x 0.5 mm 2 side polished resistivity: >50 ohm-cm Battery Cell TesterGe Wafer Specification Growing Method: CZ Orientation: (110) + 0. 7 Deg. Wafer Size: 3" dia x 0. 5 mm Surface Polishing: two sides optical polished Surface finish (RMS or Ra) : < 30A Doping: Undoped Conductor type: N type Resistivity: >50 Ohms cm (If you would like to measure the resistivity accurately, please order our Portable 4 Probe Resistivity Testing Instrument.) Package: under 1000 class clean room in wafer container Related Product Other

We don't guarantee the crimping quality if other brand cells are used

Application To seal the cylinder cell

05''                   (50

2mm) in diameter  x 0

For the properties of BK7

Conduction Type:             Semi-Insulating

A plane orientation

Conductor type:               N-type

82 Emission wavelength (nm ) 540 410 418 450 / 420 470/540 480 550 Decay constant(ns ) 900 230 0

and power cable included

Travel distance: 20mm

For milling the oxide material