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Description

HAR1-200-1042N m, 320kHz, Asymmetric Tip, No Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of High Aspect Ratio Probes Tilt Compensated High Aspect Ratio (5: 1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall deep geometries. Unmounted for all AFMs. Quantity=10 High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 5: 1 at 1um from tip apex. Tip Geometry:

please see model SNL-10

except that it allows application of a tip bias

Replacement scanner springs for all V and VLH type scanners DESCRIPTION

Every aspect of the RESP design has been optimized to provide the most accurate profiling of microscopic features

84mm) thickness

vertical edge height

- Quantity 1

Calibration Standard

Al reflective coating DESCRIPTION

5 Tip Radius (Nom): 8 Tip Radius (Max): 12 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25

025 Ωcm Silicon Cantilever Thickness (Nom): 1 - 2 Cantilever Thickness (RNG): 2

These tips are formed from a Platinum/Iridium wire and cut at the end to form the tip