Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

HMX-104 N m, 60 kHz, tr fl=17, Al Reflex Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of HarmoniX Probes For nanoscale material property mapping of standard samples in the 10MPa to 10GPa hardness range. HMX probes are preferred over HMXS version probes for stiffer and sticky samples where the tip can get more easily stuck to the surface. Unmounted for HamorniX enabled, NS5 based AFMs. Quantity=10 These probes are the

Magnetic Force Microscopy (MFM)

These probes marry the sharpness of a Silicon tip with the low spring constant and high sensitivity of a Silicon Nitride cantilever

This stainless steel cantilever holder includes a large piezo to drive the tip for low-frequency

Choose the regular cantilever holder

The holder comes with a short cable for connection to the SCM application module

determination of tip sharpness parameters

absolutely non-magnetic tweezers

7 Back Angle: 11 - 31 Side Angle: 1

nanogrid calibration standards allow the most precise AFM system calibration

Has many very sharp grain features that are useful for characterizing probesharpness

4 each 100nm

The HS-series calibration standards offers an easy and reliable way to calibrate AFM systems