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Description

PR-EX-SNM-B-10DESCRIPTION 10 pack of probes for use in the nanoIR2 s system for AFM imaging in tapping mode and for use with the scattering SNOM technique. Microfabricated platinum iridium coated silicon probes with single cantilever ~125 microns long. Pre mounted on half washer mounts for easy exchange in the nanoIR head.

KIT CONTENTS

Fused Quartz Standard

Temperature: 160° C (dependent on probe) Note: Specifically designed for use with VITA module

Bruker's Sharp Microlever (MSNL) probes are the industry standard forhigh-performance imaging with TappingMode in fluid

This optional certified step height calibration standard provides high accuracy

Cantilever & wafer tool kit: 1 scribe

50 nm full carbon CD probe

IMEC Calibration Structure - CS04 - SiB

two rubber shrouds and one cantilever mounting fixture

Replaces model STR10-1800P

7 C/m2(sq)

25 microns of gold