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Description

All-In-One-TiplessTipless AFM Probe with 4 Different Cantilevers for Various Applications DESCRIPTION CANTILEVER SPECIFICATIONS Tipless AFM Probe with 4 Different Cantilevers for Various Applications Versatile monolithic silicon AFM probe with 4 different tipless cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping non contact mode. The AFM holder chip fits most commercial

763 1000nm 1

4mm 5056 ESD Safe

metal-free lift-out grids which readily bond with Pt to attach the lamellas

602-02Q - PELCO X-Checker® B: Mn

With the good technique

Each of the diamond shaped compartments will accept a standard 3

Both the major and minor grooves

4x3mm die: Bump height (about 50nm) and width (about 150nm) not calibrated

more consistent results

Use single or dual wider posts for attaching single lamellas or the four posts for attaching a larger number of lamellas

Single size 38nm gold particles

Shape Beam Force Constant 3N/m - From 1N/m To 7N/m Resonance Frequency 75kHz - From 60kHz To 90kHz Length 225µm - From 215µm To 235µm Width 50µm - From 45µm To 55µm Thickness 3µm - From 2µm To 4µm

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